NDLI: A case study in ultrasonic cleaning damage

Content Provider	IEEE Xplore Digital Library
Author	Mallette, L.A. Chen, I. Johnson, T.W.
Copyright Year	1998
Description	Author affiliation: Hughes Space & Commun., Los Angeles, CA, USA (Mallette, L.A.)
Abstract	A single lot of 32 SAW (Surface Acoustic Wave) filters, exposed to an undocumented, post-seal, ultrasonic cleaning process, resulted in latent damage that was not discovered until late in the build cycle of a space qualified frequency synthesizer. The integrity of space qualified hardware requires the mandatory identification of root cause for all failures. The 35th frequency synthesizer in the hardware build in a multi-satellite program was subjected to acceptance level vibration testing and was observed to have a spectrum breakup. The synthesizer performed normally before and after the vibration. The failure was isolated to the fracture of a 1 mil diameter gold wire in a SAW filter. The wire, although fractured, was in contact with the ball-bond and maintained good electrical contact. SEM (Scanning Electron Microscope) examination showed evidence of significant high cycle fatigue on the fractured wire and varying amounts of fatigue (none to major) on other wires in the same filter. An investigation team prepared an Ishikawa (fishbone) diagram and eight plausible hypotheses were identified for possible root cause. This unique investigation was compounded because the filter was built eight years earlier-the investigation required significant deductive reasoning to reconstruct the facts. A total of 31 filters (14 lot acceptance test samples and 17 flight filters) from eight lot-date-codes (LDC) were examined in the SEM; testing was used to simulate several of the failure scenarios, the build history was reconstructed and inter/intra lot evaluations were performed. The analysis of the information led to a clear probable root cause and eliminated the reachback concern to other lots on other flights. It was concluded that a single lot of 32 filters was exposed to an undocumented, post-seal, ultrasonic cleaning.
Starting Page	77
Ending Page	80
File Size	618565
Page Count	4
File Format	PDF
ISBN	0780343115
ISSN	1095323X
DOI	10.1109/AERO.1998.685778
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-03-28
Publisher Place	Colorado
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Cleaning Filters Testing Wire Scanning electron microscopy Surface acoustic waves Frequency synthesizers Hardware Contacts Fatigue
Content Type	Text
Resource Type	Article
Subject	Aerospace Engineering Space and Planetary Science

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Diffraction in TV-IF Filters Using Multistrip Couplers

Scanning Acoustic Microscopy in Electronics Research

Scarring Electron Microscopy of Resonating Surface Acoustic Wave Devices

Acoustic microscopy—1979

Surface Elastic Wave Bandpass Filters for Frequency Synthesis (Short Papers)

Submicron IDT wave field investigation by scanning acoustic force microscopy

Diffraction compensation in SAW filters

Ultrasonic Pin Scanning Microscope a New Approach to Ultrasonic Microscopy

SHF-range surface acoustic wave interdigital transducers using electron beam exposure

A case study in ultrasonic cleaning damage

Similar Documents

Diffraction in TV-IF Filters Using Multistrip Couplers

Scanning Acoustic Microscopy in Electronics Research

Scarring Electron Microscopy of Resonating Surface Acoustic Wave Devices

Acoustic microscopy&#8212;1979

Surface Elastic Wave Bandpass Filters for Frequency Synthesis (Short Papers)

Submicron IDT wave field investigation by scanning acoustic force microscopy

Diffraction compensation in SAW filters

Ultrasonic Pin Scanning Microscope a New Approach to Ultrasonic Microscopy

SHF-range surface acoustic wave interdigital transducers using electron beam exposure

A case study in ultrasonic cleaning damage

Acoustic microscopy—1979