NDLI: A bit-mapping classifier expert system in warranty selection

Content Provider	IEEE Xplore Digital Library
Author	Deep, R. Czech, D.R. Dizek, S.G. Kennedy, D.K.
Copyright Year	1988
Description	Author affiliation: Anal. Sci. Corp., Fairborn, OH, USA (Deep, R.; Czech, D.R.; Dizek, S.G.; Kennedy, D.K.)
Abstract	A bit-mapped classifier system is described as a simple, effective method of distinguishing among classifiers based on descriptive features. Simple knowledge-representation techniques are used to encode a knowledge base in the domain of product performance agreements (warranties). The user interface is a simple display of features requiring a yes or no answer to indicate applicability. Feature selection is presented that ensures that each classifier can be distinguished from the others. A scoring routine based on features absent, features present, and 'don't care' track the classifiers that best fit the specified description. After starting in a data-driven mode (forward chaining), the system switches to an hypothesis-driven mode and thus economizes on the acquisition of information. A discussion on sequential acquisition information is included to show the value of an expert system that can both forward and backward chain. The system establishes a threshold score for each classifier so that when sufficient points are accumulated, the winning classifier will be declared. An explanation of the selection is given by listing the features that the user designated.<>
Starting Page	1222
Ending Page	1224
File Size	256454
Page Count	3
File Format	PDF
DOI	10.1109/NAECON.1988.195161
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1988-05-23
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Expert systems Warranties Knowledge representation Engines Logic testing User interfaces Displays Switches Working environment noise Robustness
Content Type	Text
Resource Type	Article

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