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Content Provider | IEEE Xplore Digital Library |
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Author | Hanjie Pan Blu, T. Vetterli, M. |
Copyright Year | 2015 |
Description | Author affiliation: Sch. of Comput. & Commun. Sci., Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland (Hanjie Pan; Vetterli, M.) || Electron. Eng. Dept., Chinese Univ. of Hong Kong, Hong Kong, China (Blu, T.) |
Abstract | We propose a novel edge detection algorithm with sub-pixel accuracy based on annihilation of signals with finite rate of innovation [1, 2]. We show that the Fourier domain annihilation equations can be interpreted as spatial domain multiplications. From this new perspective, we obtain an accurate estimation of the edge model by assuming a simple parametric form within each localised block. Further, we build a locally adaptive global mask function (i.e, our edge model) for the whole image. The mask function is then used as an edge-preserving constraint in further processing. Numerical experiments on both edge localisations and image up-sampling show the effectiveness of the proposed approach, which out-performs state-of-the-art method. |
Starting Page | 5977 |
Ending Page | 5981 |
File Size | 1096484 |
Page Count | 5 |
File Format | |
ISBN | 9781467369978 |
DOI | 10.1109/ICASSP.2015.7179119 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2015-04-19 |
Publisher Place | Australia |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Image edge detection Technological innovation Adaptation models Accuracy Mathematical model Image reconstruction Numerical models image up-sampling Annihilation equations sub-piexel edge detection |
Content Type | Text |
Resource Type | Article |
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