NDLI: Online mechanism for reliability and power-efficiency management of a dynamically reconfigurable core

Content Provider	IEEE Xplore Digital Library
Author	Srinivasan, S. Koren, I. Kundu, S.
Copyright Year	2015
Description	Author affiliation: ECE Dept., Univ. of Massachusetts at Amherst, Amherst, MA, USA (Srinivasan, S.; Koren, I.; Kundu, S.)
Abstract	Previous studies have shown that the best way to achieve high throughput/Watt of a single threaded application is by running it on an asymmetric multicore processor (AMP). AMPs feature cores that are tuned for specific workload characteristics. To increase efficiency, the core that offers the best power-performance trade-off for the executing thread is chosen. To reduce the overhead of thread migration, we have previously proposed a morphable core that can morph into multiple core types. In this study, apart from power-performance efficiency, we also consider the reliability of the different core types as indicated by their vulnerability to soft-errors. We show that the best core type for power-efficiency may not be the best for reliability. Accordingly, we develop a multi-objective thread migration strategy to determine the best core type considering power efficiency and reliability. To support runtime decision making, we have developed online estimators for reliability and power efficiency based on performance monitoring counters. In keeping with the existing literature, we use the architectural vulnerability factor (AVF) as the metric for reliability and $instructions-per-second^{2}/Watt$ as the metric for power efficiency. For the multi-objective optimization we use a Cobb-Douglas production function. Our results indicate that the proposed runtime mechanism for reliability and power-efficiency improves, on the average, the throughput/Watt of applications by 24% and reduces the Soft-Error Rate (SER) by 12% compared to the best static execution.
Sponsorship	IEEE
Starting Page	327
Ending Page	334
File Size	308991
Page Count	8
File Format	PDF
e-ISBN	9781467371667
DOI	10.1109/ICCD.2015.7357121
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-10-18
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Switches Multicore processing Reliability Runtime Out of order Radiation detectors
Content Type	Text
Resource Type	Article

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