NDLI: BIST generators for sequential faults

Content Provider	IEEE Xplore Digital Library
Author	Zhang, S. Byrne, R. Miller, D.M.
Copyright Year	1992
Description	Author affiliation: Dept. of Comput. Sci., Victoria Univ., BC, Canada (Zhang, S.; Byrne, R.; Miller, D.M.)
Abstract	The authors consider faults with sequential behavior, e.g., delay or stuck-open faults, and discuss the state transition properties of linear-feedback-shift-register (LFSR) and one-dimensional linear-hybrid-cellular-automata (LHCA) test pattern generators. Upper and lower bounds on the transition coverage of any general n-cell generator with a period of 2/sup n/-1 are presented. It is shown that an XLHCA/XLFSR test pattern generator, which is derived from an LHCA/LFSR by grouping the odd and even numbered cell outputs, has superior transition coverage. On the basis of analysis and results of simulating the ISCAS'85 benchmark circuits, it is concluded that the XLHCA and XLFSR are excellent candidates for test pattern generators in BIST to detect faults with sequential behavior.<>
Starting Page	260
Ending Page	263
File Size	355390
Page Count	4
File Format	PDF
ISBN	0818631104
DOI	10.1109/ICCD.1992.276264
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1992-10-11
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Built-in self-test Circuit faults Test pattern generators Delay Pattern analysis Analytical models Circuit simulation Benchmark testing Electrical fault detection Fault detection
Content Type	Text
Resource Type	Article

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