NDLI: Analysis of the Statistical Properties of the SINR in the IEEE 802.16 OFDMA Network

Content Provider	IEEE Xplore Digital Library
Author	Moiseev, S.N. Filin, S.A. Kondakov, M.S. Garmonov, A.V. Do Hyon Yim Jaeho Lee Sunny Chang Sunny Chang
Copyright Year	2006
Description	Author affiliation: SAMSUNG Electronics Co., LTD., Suwon, Korea. jhlee@samsung.com (Jaeho Lee) \|\| JSC Kodofon, Voronezh, Russia. avg@kodofon.vrn.ru (Garmonov, A.V.) \|\| JSC Kodofon, Voronezh, Russia. filin@kodofon.vrn.ru (Filin, S.A.) \|\| JSC Kodofon, Voronezh, Russia. MKondakov@kodofon.vrn.ru (Kondakov, M.S.) \|\| SAMSUNG Electronics Co., LTD., Suwon, Korea. sunny94@samsung.com (Sunny Chang) \|\| JSC Kodofon, Voronezh, Russia. smoiseev@kodofon.vrn.ru (Moiseev, S.N.) \|\| SAMSUNG Electronics Co., LTD., Suwon, Korea. ydhyon@samsung.com (Do Hyon Yim) \|\| SAMSUNG Electronics Co., LTD., Suwon, Korea. yunsang.park@samsung.com (Sunny Chang)
Abstract	In the IEEE 802.16 network the SINR per subcarrier, the average SINR, and the SINR RMS are stochastic processes. In this paper, we analyze the statistical properties of these stochastic processes using system level simulation. We present the probability density functions for the SINR per subcarrier and the average SINR stochastic processes expressed in both logarithmic and linear scales. We also present the probability density function for the SINR RMS stochastic process, expressed in the logarithmic scale. The results, obtained in this paper, allow using the statistical approach while developing the adaptive transmission algorithms for the IEEE 802.16 network.
Starting Page	5595
Ending Page	5599
File Size	6265073
Page Count	5
File Format	PDF
ISBN	1424403553
ISSN	81649547
DOI	10.1109/ICC.2006.255553
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-06-11
Publisher Place	Turkey
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Signal to noise ratio Stochastic processes Probability density function Analytical models Interference OFDM Error probability Laser sintering System performance Root mean square probability density function IEEE 802.16 OFDMA SINR
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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