NDLI: Optimal Combining with Arbitrary Power Interferers and Thermal Noise on Rayleigh Fading Channels

Content Provider	IEEE Xplore Digital Library
Author	Heewon Kang Jin Sam Kwak Hyundong Shin Stuber, G.L. Pratt, T.G.
Copyright Year	2006
Description	Author affiliation: LIDS, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139. e-mail: hshin@mit.edu (Hyundong Shin) \|\| Georgia Tech Research Institute, Atlanta, GA 30332. e-mail: Thomas.Pratt@gtri.gatech.edu (Pratt, T.G.) \|\| School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332. e-mail: stuber@ece.gatech.edu (Stuber, G.L.) \|\| School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332. e-mail: samji@ece.gatech.edu (Jin Sam Kwak) \|\| School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332. e-mail: hkang@ece.gatech.edu (Heewon Kang)
Abstract	The performance of optimum combining is studied in a Rayleigh fading environment with arbitrary-power cochannel interferers and thermal noise. Based on the joint eigenvalue distributions of quadratic forms in complex Gaussian matrices, closed form expressions for exact moment generating function (MGF) of the output signal-to-interference-plus-noise ratio are derived. From the exact MGF, the moments of the output SINR and the symbol error rate of various M-ary moulation schemes are obtained. We verify the accuracy of our analytical results by numerical examples. The new analytical framework provides a simple and accurate way to assess the effects of equal and unequal-power cochannel interferers and thermal noise on the performance of optimum combining.
Starting Page	5129
Ending Page	5133
File Size	166656
Page Count	5
File Format	PDF
ISBN	1424403553
ISSN	81649547
DOI	10.1109/ICC.2006.255480
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-06-11
Publisher Place	Turkey
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fading Diversity reception Signal to noise ratio Bit error rate Thermal engineering Working environment noise Eigenvalues and eigenfunctions Error analysis Performance analysis Adaptive arrays
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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