NDLI: ATM cell error performance of xDSL under impulse noise

Content Provider	IEEE Xplore Digital Library
Author	Nedev, N. McLaughlin, S. Laurenson, D. Daley, R.
Copyright Year	2001
Description	Author affiliation: Dept. of Electr. Eng., Edinburgh Univ., UK (Nedev, N.)
Abstract	This paper considers the cell error performance of ATM over digital subscriber lines (DSL) in the presence of impulse noise. In previous years there has been an increasing interest in xDSL technology due to its relatively broad bandwidth and ease of deployment. ATM is a preferred protocol over DSL. ATM, however, has been designed for low bit error rates. Despite error correction protocols, DSL cannot always overcome bursty errors, particularly impulse noise. Interest in DSL has triggered research into impulse noise. A new model has been developed based on surveys on experimental data. Using this model the impact of impulse noise on ATM cell error performance has been traced. Various DSL framings have been found to affect adversely the ATM stream. The interleave depth should be either 1 or large enough to correct the errors. The performance in terms of header and payload errors differs. Time between errored cells exhibits clustering like interarrival times. It is possible within one impulse event to have "good" cells between errored cells. Finally, for higher level applications error free cells is a more appropriate metric than error free seconds.
Starting Page	1254
Ending Page	1258
File Size	365791
Page Count	5
File Format	PDF
ISBN	0780370971
DOI	10.1109/ICC.2001.936893
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-06-11
Publisher Place	Finland
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Crosstalk DSL Protocols Asynchronous transfer mode Bandwidth Error correction Error analysis Europe Payloads Statistics
Content Type	Text
Resource Type	Article

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