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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Gannett, J.W. |
| Copyright Year | 1988 |
| Description | Author affiliation: Bellcore, Morristown, NJ, USA (Gannett, J.W.) |
| Abstract | Rink, an automatic layout verification system intended for FET technologies, has been enhanced to handle bipolar designs. A straightforward procedure that uses Rink's parasitic capacitance extractor to solve the bipolar device identification problem is described. The bipolar enhancements to Rink have been used successfully on a set of seven high-speed bipolar chips designed for lightwave communication. These chips ranged in complexity from 23 to 67 devices. Full-custom, nonmanhattan layouts for these chips were created on polygon-pusher style layout editors. For each chip, Rink executed an automatic comparison of the netlist extracted from the layout against a SPICE reference netlist. The latter has been coded for SPICE design simulations. Several fatal connectivity errors were uncovered as were a few significant disparities in resistor values and transistor sizes.< |
| Starting Page | 183 |
| Ending Page | 186 |
| File Size | 445726 |
| Page Count | 4 |
| File Format | |
| DOI | 10.1109/BIPOL.1988.51074 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1988-09-12 |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | FETs Integrated circuit technology Data mining Layout Graphics Parasitic capacitance Design automation Geometry Bipolar transistors Object recognition |
| Content Type | Text |
| Resource Type | Article |
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