NDLI: Using cloud computing to enhance automatic test equipment testing and maintenance capabilities

Content Provider	IEEE Xplore Digital Library
Author	Reitze, D.D.
Copyright Year	2013
Description	Author affiliation: Electron. Syst. - Defensive Syst. Div., Northrop Grumman Corp., Rolling Meadows, IL, USA (Reitze, D.D.)
Abstract	The purpose of this paper is to present a conceptual approach and to make practical recommendations on how to improve the current Automatic Test Equipment (ATE) testing and maintenance capabilities by utilizing the existing cloud computing model to build a globally linked ATE maintenance system. The basic tenet of the ATE community is to support a multi-tiered maintenance concept which, in general, is a three tiered system that is composed of organizational maintenance (O-level), intermediate maintenance (I-level), and depot maintenance (D-level) organizations. The goal of the ATE is to (1) quickly and accurately detect and isolate each fault, (2) provide software tools for analyzing historical data, and (3) gather, manage, and distribute accurate and reliable maintenance information for the failed Unit Under Test (UUT). The ATE system should provide services that will (1) maintain a repository of information that will improve fault detection and isolation, allow for off-platform assessments, document failures, and help quantify corrective actions, (2) reduce false UUT pulls, and (3) reduce repair time by prompting repair procedures. Furthermore, the ATE system should provide additional services that will help optimize the time to diagnose problems by using collected failure information and by recommending entry points into the Test Program Set (TPS) software. It should also present information to the ATE maintainer to aid in informed repair decisions which could be in the form of pilot debrief results, platform Built In Test (BIT) results, O-level test outcomes and corrective actions, and maintenance and usage history of the platform and UUT. So, based on this definition of ATE maintenance the use of cloud computing can be used to provide services to improve the overall ATE testing throughput which will result in bottom line improvements to ATE life cycle costs. By using cloud computing, which is defined to be “a model for enabling ubiquitous, convenient, on-demand network access to a shared pool of configurable computing resources (e.g., networks, servers, storage, applications, and services) that can be rapidly provisioned and released with minimal management effort or service provider interaction”, users can develop cloud computing models that will provide access to application software and databases that can be used to build a globally linked ATE maintenance system. This paper will discuss the essential characteristics of the cloud computing models and define the various flavors of cloud offerings available to designers today. This paper will also analyze the cloud computing model to arrive at a conceptual approach that can be used to enhance the current ATE Testing and Maintenance capabilities. Practical recommendations will be discussed on how to transform the current ATE Testing and Maintenance capabilities into the specific cloud computing model offerings in order to help configure a globally linked ATE maintenance system.
Sponsorship	Aerosp. Electron. Syst. Soc.
Starting Page	1
Ending Page	6
File Size	640659
Page Count	6
File Format	PDF
ISSN	10887725
e-ISBN	9781467356831
DOI	10.1109/AUTEST.2013.6645048
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-09-16
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Cloud computing Computational modeling Maintenance engineering Organizations Security Standards organizations maintenance ATE Cloud Computing architecture
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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