NDLI: Instrumenting embedded test software to support system integration, factory production and depot repair

Content Provider	IEEE Xplore Digital Library
Author	Vash, J.R.
Copyright Year	2001
Abstract	Embedded built-in test (BIT) software typically provides a system-level go/no-go indication and, in the presence of a failure, may provide some level of sub-system isolation. This level of reporting, while meeting the customer's operational requirements, does little to support system integration, production and repair. To support these other needs "instrumentation code" is added to the BIT software to provide detailed test data through an external interface. Since the BIT software already accesses the hardware parameters for testing it becomes the most logical component for the instrumentation. This paper describes the techniques of embedding instrumentation during BIT design and development to support a broad range of program test needs. It explains the costs and benefits associated with the use of instrumentation. It gives specific examples of instrumented software. It also describes how the instrumentation data can be used during environmental tests, factory test, and depot test. The impact instrumentation has on software development time, code size, execution time, and reliability is discussed as well as the cost of retrofitting BIT software to add instrumentation. Some of the benefits as well as the challenges to developing effective embedded instrumentation are examined.
Sponsorship	IEEE
Starting Page	740
Ending Page	745
File Size	365958
Page Count	6
File Format	PDF
ISBN	0780370945
ISSN	10807225
DOI	10.1109/AUTEST.2001.949457
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-08-20
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Instruments Software testing System testing Embedded software Software systems Built-in self-test Production systems Hardware Logic testing Production facilities
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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