NDLI: TPS transportability: control charting ATE

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TPS transportability: control charting ATE

Content Provider	IEEE Xplore Digital Library
Author	Miller III, J.R.
Copyright Year	1999
Description	Author affiliation: Comarco Syst. Inc., Huntsville, AL, USA (Miller, J.R., III)
Abstract	Test Program Sets, TPS, designed to run on automatic test equipment, ATE, should produce identical results when moved. Sometimes this does not happen. To answer stability questions we have control charted the various ranges of the DMM, for three different IFTE Base Shops. The data range over approximately 260 days producing eight (8) points. Averages of three points and their repeatability's are plotted. Most of the data is well within specification. In a few situations we found a flaw with the self-alignment software that allowed reference to an incorrect value.
Starting Page	539
Ending Page	542
File Size	174918
Page Count	4
File Format	PDF
ISBN	078035432X
ISSN	10807725
DOI	10.1109/AUTEST.1999.800425
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1999-08-30
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Software testing Control charts Automatic control System testing Loss measurement Time measurement Signal generators Software measurement Artificial intelligence
Content Type	Text
Resource Type	Article

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