NDLI: An Automated System for On-Wafer DC, S-Parameter, Power, and Harmonics Measurements of Broadband GaAs MMICs

Content Provider	IEEE Xplore Digital Library
Author	Kerwin, Kevin J. Thorn, Mark L. Ladd, Dean A. Fisher, Robert A. Chavez, Robert Stark, Allen
Copyright Year	1990
Description	Author affiliation: Microwave Technology Division, Hewlett-Packard Company, Santa Rosa, CA 95403 (Kerwin, Kevin J.; Thorn, Mark L.; Ladd, Dean A.; Fisher, Robert A.; Chavez, Robert; Stark, Allen)
Abstract	An automated test system for broadband on-wafer measurements of small-signal and medium power GaAs MMICs has been developed. This system is capable of S-parameter measurements to 34 GHz, harmonics measurements to 40 GHz, and power measurements to 26.5 GHz. To maximize serviceability and phase stability, and to minimize drive signal loss the test set was constructed on the autoprober top plate. A 33 dB gain multistage 2 to 26.5 GHz GaAs MMIC amplifier with frequency selective padding develops 33 dBm midband and 30 dBm at 26.5 GHz. The system delivers 22 dBm across the measurement band at the input probe tip. The network analyzer is employed as a power meter and the power measurement dynamic range is determined by the phase lock range of the reference channel sampler. A switched filter bank provides source harmonic rejection for low level harmonic measurements. A switch at the output of the DUT allows the match presented to be varied. The system employs unique calibration and measurement algorithms which result an vector error corrected S-parameters and power. Harmonics are scalar error corrected. A number of test environment features were incorporated. A camera system was designed which gives superior imaging and working space near the probecard. A laminar flow system and air deionizer have been installed to reduce particulate and ESD respectively generated during wafer test sessions. A coolant system exercise 0 to 70 degree C control of the wafer chuck.
Starting Page	107
Ending Page	116
File Size	563212
Page Count	10
File Format	PDF
ISBN	0780356861
DOI	10.1109/ARFTG.1990.324002
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1990-11-29
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Scattering parameters Power system harmonics Power measurement Gallium arsenide MMICs Power harmonic filters System testing Switches Error correction Automatic testing
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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