NDLI: Backscatter modified Mueller matrix elements from layered stratified medium

Content Provider	IEEE Xplore Digital Library
Author	Bahar, E. Kubik, R.D.
Copyright Year	1994
Description	Author affiliation: Dept. of Electr. Eng., Nebraska Univ., Lincoln, NE, USA (Bahar, E.; Kubik, R.D.)
Abstract	Backscatter specific intensities for irregular stratified structures consisting of three media are presented. They are expressed in terms of the modified Mueller (phase) matrix. The modified Mueller matrix relates the scattered (modified) Stokes vector to the incident (modified) Stokes vector. We consider the case in which the uppermost interface (facing the source) is a random rough surface. In addition to scattering and depolarization upon reflection, the incident wave also undergoes scattering and depolarization upon transmission across the rough interface. For isotropic surfaces six independent backscatter Mueller matrix elements are presented as functions of the incident angle with different roughness parameters. These modified Mueller matrix elements can be used to select the optimum backscatter angle and the wavelength that could be used to remotely detect the presence of coating materials deposited upon flat substrates.
Starting Page	1630
Ending Page	1633
File Size	185051
Page Count	4
File Format	PDF
ISBN	0780320093
DOI	10.1109/APS.1994.408139
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-06-20
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Backscatter Rough surfaces Surface roughness Electromagnetic scattering Transmission line matrix methods Electromagnetic wave absorption Attenuation Coatings Electromagnetic fields Electromagnetic wave polarization
Content Type	Text
Resource Type	Article

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