NDLI: Measured equation of invariance solution of 2-D scattering problems using line sources as metrons

Content Provider	IEEE Xplore Digital Library
Author	Zheng Lou Ming-Yi Gu Yun-Sheng Xu
Copyright Year	2003
Description	Author affiliation: Dept. of Electron. Eng. & Inf. Sci., Univ. of Sci. & Technol. of China, Anhui, China (Zheng Lou; Ming-Yi Gu; Yun-Sheng Xu)
Abstract	We choose /spl delta/ functions as metrons to generate MEI (measured equation of invariance) coefficients. For two-dimensional scattering problems, /spl delta/ metrons are equivalent to line sources placed on the surface of the object. The most important advantage of /spl delta/ metrons is that the corresponding measuring functions can be expressed analytically and no numerical integration is needed when computing the MEI coefficients. Considering that finding the MEI coefficients is the dominant part of the computation time consumed by the MEI method, we expect to greatly reduce the computation burden by using /spl delta/ functions instead of sinusoidal functions as metrons. Besides, /spl delta/ functions alleviate the ill-conditioning problem of the MEIC matrix. We have also found that the positioning of line sources must be investigated carefully in order to obtain convergent and accurate results. Our numerical practice shows that for geometry other than circular cylinders, uniformly distributed line sources do not always lead to convergent solutions as the number of coupled nodes increases. In this paper, we propose non-uniform positioning of /spl delta/ metrons around the object surface to guarantee stable and accurate solutions. Numerical results show the efficiency of the technique, especially in handling 2-D electrically large scattering problems.
Sponsorship	Northrop Grumman, Electron. Syst. Ohio State Univ. Mission Res. Corp. Nat. Sci. Found
Starting Page	323
Ending Page	326
File Size	175475
Page Count	4
File Format	PDF
ISBN	0780378466
DOI	10.1109/APS.2003.1220185
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-06-22
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Equations Electromagnetic scattering Information science Electromagnetic measurements Finite difference methods Finite element methods Iron Electromagnetic analysis Information analysis Two dimensional displays
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in