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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yeunung Chen |
| Copyright Year | 1987 |
| Description | Author affiliation: Massachusetts Institute of Technology, Lexington, Massachusetts (Yeunung Chen) |
| Abstract | Automtic speech recognition algorithms generally rely on the assumption that for the distance measure used, intraword variabilities are smaller than interword variabilities so that appropriate separation in the measurement space is possible. As evidenced by degradation of recognition perforrmnce, the validity of such an assumption decreases from simple tasks to complex tasks, from cooperative talkers to casual talkers, and from laboratory talking environments to practical talking environments. This paper presents a study of talker- stress-induced intraword variability, and an algorithm that commpensates for the systematic changes observed. The study is based on Hidden Markov Models trained by speech tokens in various talking styles. The talking styles include normal speech, fast speech, loud speech, soft speech, and talking with noise injected through earphones; the styles are designed to simulate speech produced under real stressful conditions. Cepstral coefficients are used as the parameters in the Hidden Markov Models. The stress compensation algorithm compensates for the variations in the cepstral coefficients in a hypothesis-driven manner. The functional form of the compensation is shown to correspond to the equalization of spectral tilts. Preliminary experiments indicate that a substantial reduction in recognition error rate can be achieved with relatively little increase in computation and storage requirements. |
| Starting Page | 717 |
| Ending Page | 720 |
| File Size | 202847 |
| Page Count | 4 |
| File Format | |
| DOI | 10.1109/ICASSP.1987.1169559 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1987-04-06 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Cepstral analysis Stress Robustness Speech recognition Speech enhancement Testing Degradation Training data Space technology Error analysis |
| Content Type | Text |
| Resource Type | Article |
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