NDLI: Noise Mechanisms in Small Grain Size Perpendicular Thin Film Media

Content Provider	IEEE Xplore Digital Library
Author	Jian-Gang Zhu Sokalski, V. Yiming Wang Laughlin, D.E.
Copyright Year	1965
Abstract	In this paper, we present a set of systematic experimental investigations on possible noise mechanisms for current perpendicular thin film media of small grain sizes. In particular, we focus on intergranular exchange coupling and grain boundary surface anisotropy in the granular layer of the present continuous-granular-composite film structure. Micromagnetic modeling studies are conducted to study the impact of the observed experimental phenomenon. Modeled experiments show that significant intergranular exchange coupling may occur when oxide grain boundary thickness becomes less than 1 nm. If the grain boundary thickness has significant distribution below this critical value, the exponential dependence of the coupling strength on the oxide thickness would yield significant degradation of the medium signal-to-noise ratio. Carefully designed experiments have also been conducted to study possible grain boundary interfacial anisotropy. Co/Cr, CoPt/Cr, Co/SiO₂, Co/Cr₂O₃, and Co/TiO ₂ interfaces are investigated and the corresponding interfacial anisotropy strengths are quantitatively measured. Although Co/SiO₂ interfacial anisotropy appears to be the weakest among them, the measured interfacial anisotropy energy strengths for all of them are significant fractions of the crystalline perpendicular anisotropy of the grains at present grain sizes. Finally, we investigated the impact of stacking faults in hcp Co-alloy grains. It is found that when the anisotropy strength of a small segment of a grain substantially reduces due to the existence of stacking faults, it will yield a switching field reduction disproportional to the volume ratio of the segment.
Sponsorship	IEEE Magnetics Society
Starting Page	74
Ending Page	80
Page Count	7
File Size	1741194
File Format	PDF
ISSN	00189464
Volume Number	47
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Couplings Anisotropic magnetoresistance Grain boundaries Media Grain size Magnetic hysteresis Signal to noise ratio thin film media Magnetic recording medium noise PMR media stacking faults
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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