NDLI: Testability design prevents harm

Content Provider	IEEE Xplore Digital Library
Author	Ungar, L.Y.
Copyright Year	1986
Abstract	Design for Testability (DFT) has been accepted as a cost-saving approach in many applications. The rationale has been demonstrated in several papers by calculations showing how DFT benefits derived outweigh costs. In those cases, benefits dealt with cost savings in producing, testing, and deploying it product. Apparently, such benefits are bound by an upper limit as the savings could not be greater than the cost of making the product. Herein, however, we model the revenue generation capability of a product through its life-cycle and demonstrate that the impact on profits by poor quality products can be much greater. DFT can mitigate many of the causes for poor quality products. We provide examples of recent economic harm and disaster caused by defective electronics. For these examples, we postulate what DFT could have done to mitigate the defects and how much money the companies could have saved if DFT prevented the problems. Benefits derived from DFT in the product life-cycle combines with traditionally-demonstrated DFT benefits in production, making DFT even more compelling.
Starting Page	35
Ending Page	43
Page Count	9
File Size	3141658
File Format	PDF
ISSN	08858985
Volume Number	25
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Design for testability Built-in self-test Automatic testing Electronic equipment testing System testing Integrated circuit testing Circuit faults Costs Manufacturing
Content Type	Text
Resource Type	Article
Subject	Aerospace Engineering Electrical and Electronic Engineering Space and Planetary Science

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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