NDLI: Maximum-likelihood sequence detector for dynamic mode high density probe storage

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Maximum-likelihood sequence detector for dynamic mode high density probe storage

Content Provider	IEEE Xplore Digital Library
Author	Kumar, N. Agarwal, P. Ramamoorthy, A. Salapaka, M.
Copyright Year	1972
Abstract	There is an increasing need for high density data storage devices driven by the increased demand of consumer electronics. In this work, we consider a data storage system that operates by encoding information as topographic profiles on a polymer medium. A cantilever probe with a sharp tip (few nm radius) is used to create and sense the presence of topographic profiles, resulting in a density of few Tb per in.². The prevalent mode of using the cantilever probe is the static mode that is harsh on the probe and the media. In this article, the high quality factor dynamic mode operation, that is less harsh on the media and the probe, is analyzed. The read operation is modeled as a communication channel which incorporates system memory due to inter-symbol interference and the cantilever state. We demonstrate an appropriate level of abstraction of this complex nanoscale system that obviates the need for an involved physical model. Next, a solution to the maximum likelihood sequence detection problem based on the Viterbi algorithm is devised. Experimental and simulation results demonstrate that the performance of this detector is several orders of magnitude better than the performance of other existing schemes.
File Size	1393602
File Format	PDF
ISSN	00906778
Volume Number	58
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Maximum likelihood detection Detectors Probes Memory Consumer electronics Data storage systems Polymers Q factor Communication channels Interference Nanotechnology, probe storage, maximum likelihood sequence detection, atomic force microscopy.
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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