NDLI: Barkhausen Noise and Magnetic Properties of Plastically Deformed Silicon Steels

Content Provider	IEEE Xplore Digital Library
Author	Baiotto, R. Gerhardt, G. Fukuhara, M. Yonamine, T. Missell, F.P.
Copyright Year	1965
Abstract	We present Barkhausen noise and magnetic measurements on two fully processed, nonoriented electrical steels which had been cold-rolled to thickness reductions of up to 60%. Both coercive field H_c and hysteresis loss W_h show an almost linear increase with thickness reduction up to the highest deformations. These changes are almost fully reversed after vacuum annealing for 2 h at 760°C. The hysteresis loss can be conveniently subdivided into high and low induction components as suggested by recent modelling. Electron back-scatter diffraction (EBSD) shows no texture change during initial phases of cold-rolling. Barkhausen noise measurements were obtained on both cold-rolled and annealed samples. The undeformed material shows a Barkhausen signature consisting of two small peaks which coalesce into one peak upon plastic deformation and thereafter grow steadily. Annealing the material brings back the two-peaked signature. These results are discussed and hypotheses are presented for the behavior of the Barkhausen noise.
Sponsorship	IEEE Magnetics Society
Starting Page	294
Ending Page	297
Page Count	4
File Size	211253
File Format	PDF
ISSN	00189464
Volume Number	46
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Magnetic noise Magnetic properties Silicon Steel Annealing Magnetic hysteresis Phase change materials Noise reduction Magnetic variables measurement Electrons silicon steel Barkhausen noise coercive field EBSD hysteresis loss plastic deformation
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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