NDLI: Use of Magnetic Links to Measure the Maximum Rate-of-Rise of Lightning Currents

Content Provider	IEEE Xplore Digital Library
Author	Wang Ju-feng Qi Chong Liang Xiao-bing Che Yi-ying Fan Li-li Wang Yan-lei
Copyright Year	1986
Abstract	The maximum rate-of-rise of lightning currents is a critical parameter in lightning protection. The study shows that with two magnetic links, which are prerecorded with calibrated signal, laid simultaneously nearby the lightning channel and in quadrature with each other, the maximum rate-of-rise of lightning currents can be measured directly. The physical and mathematical models are established to describe the demagnetization of the links. The signal-erased length for the link placed in parallel way is determined by the lightning field intensity as well as the inducted current in the link which is proportional to the maximum rate-of-rise; and the signal-erased length for perpendicularly placed link solely relates to the lightning field intensity, the inducted current effect is negligible in this case. So, by calculating the difference between two signal-erased lengths, the maximum lightning rate-of-rise can be determined. The experiments show that the measuring error of this method is less than 5%.
Sponsorship	IEEE Power Engineering Society
Starting Page	2445
Ending Page	2449
Page Count	5
File Size	661995
File Format	PDF
ISSN	08858977
Volume Number	22
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-10-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Current measurement Magnetic field measurement Perpendicular magnetic recording Magnetic domains Lightning protection Demagnetization Mathematical model Fires Electronic equipment Aircraft rate-of-rise Lightning measurement magnetic links
Content Type	Text
Resource Type	Article
Subject	Energy Engineering and Power Technology Electrical and Electronic Engineering

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