NDLI: Neural-network-based parasitic modeling and extraction verification for RF/millimeter-wave integrated circuit design

Content Provider	IEEE Xplore Digital Library
Author	Sen, P. Woods, W.H. Sarkar, S. Pratap, R.J. Dufrene, B.M. Mukhopadhyay, R. Chang-Ho Lee Mina, E.F. Laskar, J.
Copyright Year	1963
Abstract	This paper reports an interconnect modeling approach for RF and millimeter-wave integrated circuits (ICs) using neural network models and a novel parasitic extraction verification procedure using automatically generated test structures. The effects of the parasitics in RF/millimeter-wave ICs are investigated with special focus on the parasitic inductances, since they are not evaluated by most of the commercially available extraction tools. State-of-the-art silicon-based multilayer RF process parameters are utilized to extract the resistive, the capacitive, and the inductive components of the layout interconnects. Neural network models are developed using electromagnetic (EM) simulation results of a set of passive interconnect structures. In addition, an automated layout generation methodology is used for the verification of the parasitic extraction methodologies. The proposed verification approach is demonstrated using automatically generated passive test structures and ring oscillators. The effects of parasitics are also investigated in voltage-controlled oscillators (VCOs) and amplifiers for millimeter-wave applications, and the neural models are verified using 30-GHz VCO measurement results. Hence, we present a complete modeling report of layout interconnect parasitics in RF/millimeter-wave integrated circuits as well as a novel verification procedure to validate non-EM analytical or neural models
Sponsorship	IEEE Microwave Theory and Techniques Society
Starting Page	2604
Ending Page	2614
Page Count	11
File Size	1794768
File Format	PDF
ISSN	00189480
Volume Number	54
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Integrated circuit modeling Radio frequency Millimeter wave integrated circuits Integrated circuit interconnections Circuit testing Neural networks Automatic testing Millimeter wave technology Voltage-controlled oscillators Millimeter wave measurements tool verification Neural network parasitic extraction parasitic inductances
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electrical and Electronic Engineering Radiation

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