NDLI: Compact high-brightness soft X-ray Cherenkov sources

Content Provider	IEEE Xplore Digital Library
Author	Knulst, W. Luiten, J. Verhoeven, J.
Copyright Year	1995
Abstract	Compact narrow-band high-brightness soft X-ray sources based on the Cherenkov effect are very promising. We discuss the theoretical basis for this novel electron-accelerator-based source. We present results of experiments, which confirm the theoretical expectations and demonstrate that intense narrow-band Cherenkov light can be produced at the silicon L-edge (99.7 eV) and, in the water window, at the titanium L-edge (453 eV) and the vanadium L-edge (512 eV). On the basis of theory and experiment, we show that a compact high-brightness Cherenkov source may be realized, which fulfills the requirements for practical soft X-ray microscopy and photoelectron spectroscopy.
Sponsorship	IEEE Lasers and Electro-Optics Society
Starting Page	1414
Ending Page	1425
Page Count	12
File Size	465645
File Format	PDF
ISSN	1077260X
Volume Number	10
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-11-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Plasma sources Ultraviolet sources Plasma x-ray sources Plasma applications Fluorescence Gas lasers Optical pulse generation Narrowband Silicon Photoelectron microscopy X-ray microscopy Cherenkov effect extreme ultraviolet (EUV) photoelectron spectroscopy soft X-rays
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Electrical and Electronic Engineering

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