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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chiriac, H. Neagu, M. Hison, C. |
| Copyright Year | 1965 |
| Abstract | The effects of Fe content as well as the dc or ac stress current annealing conditions (current density, annealing time, and tensile stress) on the magnetoelastic behavior of amorphous Co/sub 72.5-x/Fe/sub x/Si/sub 12.5/B/sub 15/ (x=0, 3, 4.35, 5, and 7. at.%) glass-covered wires have been investigated. The saturation magnetostriction at zero applied stress /spl lambda//sub s/ (0) in the as-cast state of the samples is about -2.8/spl times/10/sup -6/; -0.6/spl times/10/sup -6/; -0.11/spl times/10/sup -6/; 0.36/spl times/10/sup -6/, and 0.9/spl times/10/sup -6/ for x=0, 3, 4.35, 5, and 7 at.% Fe, respectively. For nearly zero magnetostrictive amorphous Co/sub 68.15/Fe/sub 4.35/Si/sub 12.5/B/sub 15/ glass-covered wire, after stress current annealing /spl lambda//sub s/ (0) changes from small negative to small positive values. The positive /spl lambda//sub s/ (0) values are obtained after about 3-8 min annealing time for current densities higher than 130/spl times/10/sup 6/ A/m/sup 2/. The ac stress current annealing leads to an increase with maximum 60% of the maximum saturation magnetostriction value /spl lambda//sub s/ (0)/sub max/ (depending on the frequency value) in comparison with dc annealing for the same current density, treatment time, and tensile stress. For alloys with x=0, 3, 5, and 7 at.% Fe, after dc or ac stress current annealing with (60-180)/spl times/10/sup 6/ A/m/sup 2/, under 300-800 MPa, a modification up to 10% in /spl lambda//sub s/ (0) values was observed (the absolute value for negative magnetostrictive samples decreases while for positive magnetostrictive samples increases). |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 2823 |
| Ending Page | 2825 |
| Page Count | 3 |
| File Size | 205037 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 38 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2002-09-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Amorphous magnetic materials Amorphous materials Tensile stress Magnetostriction Annealing Saturation magnetization Iron Current density Wires Frequency |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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