NDLI: Diffraction-pattern sampling for automatic pattern recognition

Content Provider	IEEE Xplore Digital Library
Author	Lendaris, G.G. Stanley, G.L.
Copyright Year	1963
Abstract	This paper describes diffraction-pattern sampling as a basis for automatic pattern recognition in photographic imagery; it covers: diffraction-pattern generation, diffraction-pattern/image-area relationships, diffraction-pattern sampling, algorithm development (using an interactive computer-graphic based facility), facility description, and experimental results which have been obtained over the last few years at General Motors' AC Electronics-Defense Research Laboratories, Santa Barbara, Calif. Sampling the diffraction pattern results in a sample signature--a different one for each sampling geometry. The kinds of information obtainable from sample signatures are described, and considerations for developing algorithms based on such information are discussed. A tutorial section is included for the purpose of giving the reader an intuitive feeling for the kinds of information contained in a diffraction pattern and how it relates to the original photographic imagery.
Sponsorship	IEEE Publication
Starting Page	198
Ending Page	216
Page Count	19
File Size	10029633
File Format	PDF
ISSN	00189219
Volume Number	58
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1970-02-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Diffraction Sampling methods Pattern recognition Image sampling AC motors AC generators Image generation Laboratories Geometry
Content Type	Text
Resource Type	Article
Subject	Computer Science Electrical and Electronic Engineering

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