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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Salameh, D. Linton, D. |
| Copyright Year | 1963 |
| Abstract | Nonlinear transmission-line (NLTL) shock-wave generator performance in the presence of frequency-dependent losses is reported. The skin effect is studied using the harmonic-balance technique with the aid of the HP-MDS design database language. Measured results of a 48-section NLTL excited by a 26.6-dBm sinusoidal signal from the literature are compared with simulation with good agreement. Experimental performance of an eight-section GaAs monolithic-microwave integrated circuit NLTL is reported for 26-dBm drive conditions. Schottky diode capacitance-voltage (C-V) characteristics are computed using the Silvaco physical simulator for different doping profiles. Doping profiles are used as a parameter in NLTL design and their effect on NLTL performance is investigated. S-parameter measurements are performed for the GEC Marconi Materials Technology GaAs Schottky diode family from which the C-V characteristics are extracted and used to validate simulation. The problem of variable dynamic range is addressed and variable diode areas are used to enhance matching. |
| Sponsorship | IEEE Microwave Theory and Techniques Society |
| Starting Page | 350 |
| Ending Page | 353 |
| Page Count | 4 |
| File Size | 115318 |
| File Format | |
| ISSN | 00189480 |
| Volume Number | 47 |
| Issue Number | 3 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1999-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Schottky diodes Capacitance-voltage characteristics Integrated circuit measurements Computational modeling Circuit simulation Gallium arsenide Doping profiles Transmission lines Performance loss Frequency |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering Radiation |
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