NDLI: Technique for Obtaining Radiation Hardened Semiconductor Devices by Irradiating Wafers

Content Provider	IEEE Xplore Digital Library
Author	Cates, Harold T. Darling, Ray E. Davidsohn, Ury
Copyright Year	1963
Abstract	Many military electronic systems are required to function during or after exposure to a nuclear radiation environment. Bipolar transistors and related integrated circuits are very sensitive to the effects of neutron damage that decrease transistor current gain and increase transistor saturation resistance. These effects may result in post-irradiation circuit failure at neutron fluences below radiation specification, particularly when ordinary neutron effect screening techniques are used. This paper describes a screening technique that assures postirradiation electrical performance of semiconductor piece parts, eliminates the problem associated with the so-called "maverick" or unpredictable transistor, and monitors the effects of manufacturing process changes. This technique is economically attractive when applied on a lot-to-lot basis. Nuclear radiation is an additional environment to be considered in production lot-to-lot semiconductor quality assurance. For any environment, acceptable products are determined by 100 percent screening tests to the specification level (Group A) followed by sample environmental tests (Group B) that measure the level of success of the initial screening procedure. If silicon wafers have been subjected to reactor radiation, Group A and Group B screening techniques can be used to screen semiconductor devices for radiation effects on electrical parameters. This is accomplished by irradiating and thermal annealing the in-process silicon wafers, subjecting them to Group A tests and then subjecting samples to Group B tests. The screening technique has been demonstrated practical and repeatable through use of the White Sands Missile Range Fast Burst Reactor (FBR) and the University of Arizona TRIGA Reactor.
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	183
Ending Page	189
Page Count	7
File Size	1275792
File Format	PDF
ISSN	00189499
Volume Number	17
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1970-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Radiation hardening Semiconductor devices Testing Neutrons Inductors Bipolar transistor circuits Silicon Bipolar transistors Bipolar integrated circuits Electric resistance
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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