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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Cassidy, Esther Christmas Cones, Harold N. Booker, Stanley R. |
| Copyright Year | 1963 |
| Description | Use of the Kerr electrooptical effect for time-resolved pulse measurements is extended to the 300-kV level. Pulse durations are as short as 5 ¿s. The performance of systems equipped with Kerr cells of various designs is investigated under a variety of operating conditions. Calibrations are achieved using both pulse-divider and high direct-voltage techniques. Methods are devised for measurement and correction of errors resulting from the fringing electric field at the ends of the Kerr-cell electrodes. Measurements of the temperature coefficient of the Kerr-cell constant are also included. The pulse waveform is reconstructed from typical Kerr-system results by automatic computation and compared with simultaneous time-resolved pulse-divider measurements. Comparisons at the peak of the pulse, where a "slideback" technique is used to enhance the resolution of the divider measurement, demonstrate agreement to better than 1 percent. In addition, a novel technique is developed for measurement of the pulse magnitude from photographs of the Kerr-effect fringe patterns produced by passing an expanded, pulsed laser beam through the system. By this approach, voltage is measured optically without use of sophisticated electrical metering instrumentation. |
| Sponsorship | IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc |
| Starting Page | 395 |
| Ending Page | 402 |
| Page Count | 8 |
| File Size | 5430883 |
| File Format | |
| ISSN | 00189456 |
| Volume Number | 19 |
| Issue Number | 4 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1970-11-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Pulse measurements Electric variables measurement Temperature measurement Optical pulses Calibration Error correction Electrodes Laser beams Voltage measurement Instruments |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Electrical and Electronic Engineering |
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