NDLI: Study and characterization of optoelectronic photoconductor-based probes

Content Provider	IEEE Xplore Digital Library
Author	Voelker, R.H. Frankel, M.Y. Sentelle, C.G.
Copyright Year	1963
Abstract	Photoconductor sampling probes are important for optoelectronic device and circuit measurement applications. We use the finite-difference transmission line matrix (FD-TLM) method to characterize the ultrafast photoconductor sampling probes' fundamental performance limits imposed by electromagnetic constraints. Both on-wafer and free-standing photoconductor probes are investigated as applied to microstrip lines found in millimeter-wave integrated circuits and as applied to coplanar strip lines found in ultrafast device characterization systems. Localized invasiveness, distributed loading, and measurement accuracy are investigated for various probing configurations and orientations. Localized invasiveness is small for all our simulations. Distributed loading is negligible for cases where the guided-mode field confinement is tighter than the spatial separation between the probe support structure and the transmission line. Measurement accuracy is acceptable for simulated structures, but amplitude calibration precision may be compromised. We also study photoconductor probes for high-bandwidth signal generation on transmission line structures. The generated signals follow the photoconductor switch photocurrent signal for cases where both the probe and the transmission line form well-matched guiding-wave structures but are attenuated and distorted for other cases.
Sponsorship	IEEE Microwave Theory and Techniques Society
Starting Page	331
Ending Page	337
Page Count	7
File Size	923781
File Format	PDF
ISSN	00189480
Volume Number	44
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1996-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Photoconductivity Probes Transmission line measurements Photoconducting devices Sampling methods Electromagnetic measurements Integrated circuit measurements Transmission line matrix methods Signal generators Switches
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electrical and Electronic Engineering Radiation

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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