NDLI: Generation of microparticles from copper-chromium contacts in vacuum

Content Provider	IEEE Xplore Digital Library
Author	Kamikawaji, T. Shioiri, T. Funahashi, T. Okawa, M. Kaneko, E. Ohshima, I.
Copyright Year	1986
Abstract	Using a scanning electron microscope (SEM) and a laser microscope, we observed micro-flakes and particles. On machined Cu-Cr contacts which were considered to be built-up edges due to machining. A large number of microparticles of 5.7-8.7/spl times/10/sup 3/ from a contact surface of 1 cm/sup 2/, were generated from the machined Cu-Cr contacts during opening and closing operations of normal current. The size of typical microparticles was some tens /spl mu/m and those larger than 100 /spl mu/m were occasionally observed. This implies that the surface of machined Cu-Cr contacts must be treated by any means when they are used for vacuum interrupters. Current conditioning is one of the effective surface treatments. Although the surface roughness of the contacts increases through the current conditioning, the improvement of insulating ability is brought by the elimination of micro-flakes and particles and by the formation of a fine structure layer preventing partial detachment of the contact material.<>
Sponsorship	IEEE Power Engineering Society
Starting Page	286
Ending Page	293
Page Count	8
File Size	1049648
File Format	PDF
ISSN	08858977
Volume Number	10
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Scanning electron microscopy Circuit breakers Surface treatment Machining Rough surfaces Surface roughness Contacts Optical materials Dielectrics and electrical insulation Surface contamination
Content Type	Text
Resource Type	Article
Subject	Energy Engineering and Power Technology Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Electrode roughness effects on the breakdown of air-insulated apparatus

Electrical and physical characterization of SiFe sheets insulation

High-current interruption in vacuum circuit breakers

Fundamental insulation characteristic of high-pressure CO/sub 2/ gas under actual equipment conditions

Arc-contact-insulating wall interactions in low voltage circuit-breakers

Breakdown voltage of electrode arrangements in vacuum circuit breakers

Degradation of polymer dielectrics with nanometric metal-oxide fillers due to surface discharges

Effect of mechanical finishes on secondary electron emission of alumina ceramics

Nanoscale Surface Roughness Effects on THz Vacuum Electron Device Performance

Generation of microparticles from copper-chromium contacts in vacuum

Similar Documents

Electrode roughness effects on the breakdown of air-insulated apparatus

Electrical and physical characterization of SiFe sheets insulation

High-current interruption in vacuum circuit breakers

Fundamental insulation characteristic of high-pressure CO/sub 2/ gas under actual equipment conditions

Arc-contact-insulating wall interactions in low voltage circuit-breakers

Breakdown voltage of electrode arrangements in vacuum circuit breakers

Degradation of polymer dielectrics with nanometric metal-oxide fillers due to surface discharges

Effect of mechanical finishes on secondary electron emission of alumina ceramics

Nanoscale Surface Roughness Effects on THz Vacuum Electron Device Performance

Generation of microparticles from copper-chromium contacts in vacuum