NDLI: Acoustic microscopy measurement of elastic constants and mass density

Content Provider	IEEE Xplore Digital Library
Author	Yung-Chun Lee Kim, J.O. Achenbach, J.D.
Copyright Year	1986
Abstract	A method is presented to determine the elastic constants and the mass density of isotropic and anisotropic solids and anisotropic thin films. The velocity and attenuation of leaky surface acoustic waves (SAWs) have been obtained for specified propagation directions from V(z) curves measured by line-focus acoustic microscopy (LFAM). The experimentally obtained velocities have been compared to velocities obtained from a measurement model for the V(z) curve which simulates the experiment. Since the measured and simulated V(z) curves have the same systemic errors, the material constants are free of such errors. For an isotropic solid, Young's modulus E, the shear modulus G and the mass density /spl rho/ have been determined from the leaky Rayleigh wave velocity and attenuation, measured by LFAM, and a longitudinal wave velocity measured by a pulse-echo transit-time technique. For a cubic-crystalline solid, the ratios of the elastic constants to the mass density (c/sub 11///spl rho/, c/sub 12///spl rho/, c/sub 44///spl rho/) have been determined from the directional variation of measured SAW velocities, using a preliminary estimate of /spl rho/. The mass density /spl rho/ has subsequently been determined by additionally using the attenuation of leaky SAWs in crystal symmetry directions. For a cubic-crystalline thin film deposited on a substrate, the elastic constants and the mass density (c/sub 11/, c/sub 12/, c/sub 44/, /spl rho/) of the film have been determined from the directional variation of the measured SAW velocities, and a comparison of the corresponding attenuation coefficient with the measured attenuation coefficient has been used to verify the results.<>
Starting Page	253
Ending Page	264
Page Count	12
File Size	545765
File Format	PDF
ISSN	08853010
Volume Number	42
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Microscopy Acoustic measurements Velocity measurement Attenuation measurement Density measurement Surface acoustic waves Solids Pulse measurements Anisotropic magnetoresistance Sawing machines
Content Type	Text
Resource Type	Article
Subject	Acoustics and Ultrasonics Instrumentation Electrical and Electronic Engineering

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