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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hyung Jin Kim Sang Hee Hong |
| Copyright Year | 1973 |
| Abstract | The ion and electron temperatures and plasma flow velocities are measured and compared between atmospheric and low pressure plasma spraying systems. The measurements of ion temperature for two systems are carried out by an optical emission spectroscopy which uses the relative emissivities of isolated Ar I emission lines. The electron density and temperature are measured by a Langmuir probe rotating across the plasma jets. The ion saturation currents collected by a Mach probe at two orientations, perpendicular and parallel to the plasma jet, determine the flow velocity. The spatial distributions of electron density, plasma flow velocity, and the associated shock activity in thermal plasma jets are discussed in conjunction with their direct dependency upon the ambient pressures as well as the torch powers. Measurements on temperatures and velocity profiles of thermal plasma jets reveal the general features of the LPPS jet characteristics, i.e., higher velocity flow with lower temperature, longer heating zone of expanded flame, and more extended accelerating zone compared with those of the APS jets. The shock activity clearly exists in the form of standing shock waves in the plasma jet of LPPS in view of flow compression and abrupt velocity drop which are appeared in the results of measurements on the variations of electron density and flow velocity along the plasma jet. In the center of the plasma jet of APS, the electron density is high enough to reach the LTE criterion, and the difference between ion and electron temperatures becomes insignificant as the torch input power increases.< |
| Sponsorship | IEEE Nuclear and Plasma Sciences Society |
| Starting Page | 852 |
| Ending Page | 859 |
| Page Count | 8 |
| File Size | 760881 |
| File Format | |
| ISSN | 00933813 |
| Volume Number | 23 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1995-10-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Plasma measurements Plasma properties Plasma temperature Plasma density Electrons Temperature measurement Atmospheric measurements Plasma waves Fluid flow measurement Velocity measurement |
| Content Type | Text |
| Resource Type | Article |
| Subject | Nuclear and High Energy Physics Condensed Matter Physics |
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