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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hjelme, D.R. Mickelson, A.R. |
| Copyright Year | 1963 |
| Abstract | A detailed study of various voltage calibration factors or the direct electrooptic sampling technique is presented. In reflection mode optical probing, the circuit substrate forms an etalon for the optical probe beam. Analytical expressions for the calibration factors due to etalon effects and decaying surface potentials are derived. on the length of the sampling pulse relative to the substrate transit time, the etalon will affect either the voltage calibration factor or the system bandwidth: For pulses that are long compared to the transient time, interference at the surface results in a probe wavelength dependent storage time effect. The resulting electrooptic signal shows a resonant behavior as a function of wavelength or substrate thickness. For pulses that are short compared to the substrate transit time, multiple reflections reduce the effective system bandwidth to a bandwidth less than that given by the single transit time or the sampling pulse width. Experimental verification of the theoretical results is presented. Various deembedding procedures for implementing the voltage calibration are discussed.< |
| Sponsorship | IEEE Microwave Theory and Techniques Society |
| Starting Page | 1941 |
| Ending Page | 1950 |
| Page Count | 10 |
| File Size | 1119675 |
| File Format | |
| ISSN | 00189480 |
| Volume Number | 40 |
| Issue Number | 10 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1992-10-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Voltage Calibration Sampling methods Bandwidth Optical reflection Optical beams Probes Surface waves Optical surface waves Optical pulses |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering Radiation |
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