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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Mesa, F.L. Cano, G. Medina, F. Marques, R. Horno, M. |
| Copyright Year | 1963 |
| Abstract | The characteristic parameters of coplanar multistrip lines embedded in multilayered lossless/lossy substrates are commonly computed by using either quasi-TEM or full-wave model. Several methods are provided in the literature to deal with this type of structure. A comparative study of quasi-TEM and rigorous solutions is carried out in order to establish criteria for the validity of the quasi-TEM approach. Reliable quasi-TEM and full-wave numerical data have been properly generated by applying an enhanced spectral domain analysis. The authors conclude that the quasi-TEM model yields satisfactory results for many MIC and MMIC practical cases. However, significant errors arise when high conductivity substrates are involved in MMIC applications. A discussion about the computation of the dynamic modal characteristic impedance is also reported, showing how the insertion of the modal orthogonality can save computational effort in a lossy multiport system.< |
| Sponsorship | IEEE Microwave Theory and Techniques Society |
| Starting Page | 524 |
| Ending Page | 531 |
| Page Count | 8 |
| File Size | 907647 |
| File Format | |
| ISSN | 00189480 |
| Volume Number | 40 |
| Issue Number | 3 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1992-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Dielectric losses Dielectric substrates MMICs Microwave integrated circuits Strips Conductivity Conductors Propagation losses Nonhomogeneous media Embedded computing |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering Radiation |
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