NDLI: Six-port and four-port reflectometers for complex permittivity measurements at submillimeter wavelengths

Content Provider	IEEE Xplore Digital Library
Author	Stumper, U.
Copyright Year	1963
Abstract	The frequency range of six-port reflectometry is extended into the submillimeter wavelength range. The complex permittivity of low-loss microwave materials is determined using novel six-port and four-port reflectometers. These either consist of quasi-optical components or utilize oversized waveguide techniques. Permittivity measurements of materials possessing a wide range of values of epsilon ' (2 to 7) and of the loss tangent (0.0003 to 0.03) were carried out at frequencies of about 380 GHz to 390 GHz. Good agreement with published permittivity data is shown. Moreover, the equivalance of the simple waveguide four-port reflectometer (which is preferred because of its easy handling and high stability against temperature fluctuations) to the quasi-optical reflectometers is shown.<>
Sponsorship	IEEE Microwave Theory and Techniques Society
Starting Page	222
Ending Page	230
Page Count	9
File Size	1108776
File Format	PDF
ISSN	00189480
Volume Number	37
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1989-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Submillimeter wave measurements Permittivity measurement Frequency Dielectric loss measurement Dielectric measurements Wavelength measurement Dielectric losses Submillimeter wave technology Reflection Reflectometry
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electrical and Electronic Engineering Radiation

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