NDLI: Stability of superconductors for poloidal field coil application

Content Provider	IEEE Xplore Digital Library
Author	Schmidt, C. Yi, C.
Copyright Year	1965
Abstract	Experiments were performed on a Cu/CuNi/NbTi mixed-matrix conductor which was supplied with a transport current and exposed to magnetic-field pulses of typically ten milliseconds length and with a dB/dt up to a few hundred tesla per second. Various cooling regimes were employed: bath cooling, supercritical helium, and liquid helium in a closed, small volume (the case of a cable in conduit conductor). The stability limit was found to be determined mainly by the transient heat transfer during the pulse. A stability model is developed which compares the energy coupled into the conductor by the field pulse with the energy which can be absorbed by the near-surface helium layer due to the transient heat transfer. The model assumes that the stability for a short heat pulse is determined by the transient heat transfer during the pulse. The description of transient heat transfer is based on diffusion models; no convective effects are considered. The relevant quantity describing the disturbance is energy input per unit cooled conductor surface. The model is derived for a uniform heat input during a pulse time (rectangular heat pulse), for different cooling conditions.<>
Sponsorship	IEEE Magnetics Society
Starting Page	1159
Ending Page	1162
Page Count	4
File Size	370244
File Format	PDF
ISSN	00189464
Volume Number	24
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1988-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Stability Superconductivity Superconducting coils Heat transfer Conductors Cooling Niobium compounds Titanium compounds Superconducting magnets
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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