NDLI: 9-GHz Complex Permittivity Measurements of High-Loss Liquids Using a Variable-Length Reflection Cavity and a Dual-Channel, Double Superheterodyne Signal Processing System

Content Provider	IEEE Xplore Digital Library
Author	Buckmaster, H.A. Van Kalleveen, T.H.T. Zaghloul, H. Hansen, C.H.
Copyright Year	1963
Description	This paper evaluates those factors which limit the accuracy with which microwave complex permittivity measurements of high-loss liquids can be made using a variable-length reflection sample cell spectrometer. Measurements made at 0.001-in increments from a cell length of 0.11 into 0.31 in were found to be statistically independent of the reflector diameter in the interval 0.5 in to 4.25 in. The data were analyzed using expressions for the amplitude and phase derived assuming a plane wave model. It is found that the permittivity epsilon' and the loss epsilon" can be determined typically to a precision of 0.3 percent and 0.5 percent, respectively, using a 9.354-GHz dual-channel, double superheterodyne signal processing system. However, there is a discrepancy of about two standard deviations between the values of epsilon' and epsilon" obtained from the phase data and those obtained from the amplitude data. Moreover, it is also found that the values of epsilon' and epsilon" caculated from these data differ by more than three standard deviations from those obtained using a variable-length transmission sample cell and the same signal processing system. These discrepancies, which exceed 1 percent are attributed to deficiencies in the plane wave model. It has been confirmed using 0.011 and 0.051 mol l/sup -1/ KCl solutions that the sensitivity achievable with the reflection cell is less by a factor of 100 than that with a transmission sample cell, which is in agreement with the estimated precision obtainable with these two different types of sample cells.
Sponsorship	IEEE Microwave Theory and Techniques Society
Starting Page	909
Ending Page	916
Page Count	8
File Size	885116
File Format	PDF
ISSN	00189480
Volume Number	35
Issue Number	10
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1987-10-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Permittivity measurement Reflection Signal processing Microwave measurements Spectroscopy Microwave frequencies Frequency measurement Dielectric measurements Dielectric liquids Length measurement
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electrical and Electronic Engineering Radiation

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Complex Permittivity of GaAs and CdTe at Microwave Frequencies

Round robin test on a cavity resonance method to measure complex permittivity of dielectric plates at microwave frequency

Measurements of Complex Permittivity at Millimeter-Wave Frequencies With an End-Loaded Cavity Resonator

Measurements of Permittivity, Dielectric Loss Tangent, and Resistivity of Float-Zone Silicon at Microwave Frequencies

Measurement of dielectric parameters of small samples at X-band frequencies by cavity perturbation technique

In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: theory (part I)

Extended cavity perturbation technique to determine the complex permittivity of dielectric materials

Estimation of complex permittivity of arbitrary shape and size dielectric samples using cavity measurement technique at microwave frequencies

Automatic Determination of the Complex Permittivity of Liquids of Low Dielectric Loss

9-GHz Complex Permittivity Measurements of High-Loss Liquids Using a Variable-Length Reflection Cavity and a Dual-Channel, Double Superheterodyne Signal Processing System

Similar Documents

Complex Permittivity of GaAs and CdTe at Microwave Frequencies

Round robin test on a cavity resonance method to measure complex permittivity of dielectric plates at microwave frequency

Measurements of Complex Permittivity at Millimeter-Wave Frequencies With an End-Loaded Cavity Resonator

Measurements of Permittivity, Dielectric Loss Tangent, and Resistivity of Float-Zone Silicon at Microwave Frequencies

Measurement of dielectric parameters of small samples at X-band frequencies by cavity perturbation technique

In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: theory (part I)

Extended cavity perturbation technique to determine the complex permittivity of dielectric materials

Estimation of complex permittivity of arbitrary shape and size dielectric samples using cavity measurement technique at microwave frequencies

Automatic Determination of the Complex Permittivity of Liquids of Low Dielectric Loss

9-GHz Complex Permittivity Measurements of High-Loss Liquids Using a Variable-Length Reflection Cavity and a Dual-Channel, Double Superheterodyne Signal Processing System