NDLI: Corrosion behavior of CoCr films in Sulfuric acid

Content Provider	IEEE Xplore Digital Library
Author	Wang, T. Warren, G.
Copyright Year	1965
Abstract	The corrosion behavior of CoCr films (∼500 to 1000 nm thick) deposited on glass by RF sputtering has been examined by classical electrochemical methods which provide a simple and rapid means for comparing one material with another. The development of a specially designed holder to allow electrical contact to the film and exposure to a sulfuric acid electrolyte was required. A comparison of potentiodynamic polarization curves for films containing various amounts of Cr with similar data from the literature for bulk CoCr alloys showed analogous behavior in the shape of the curve and in the level of Cr required to produce passivity, about 15-17%. Results indicate the formation of a passive layer containing a chromium oxide. In addition, comparison of an as-received sample with an electrochemically treated sample using Auger electron spectroscopy along with polarization results showed that Co oxides are apparently stabilized by the presence of Cr. Auger results also suggest that corrosion and passivation occur along the spaces or crevices between columnar grains during electrochemical treatment as indicated by the presence of a significant oxygen content.
Sponsorship	IEEE Magnetics Society
Starting Page	340
Ending Page	342
Page Count	3
File Size	602465
File Format	PDF
ISSN	00189464
Volume Number	22
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1986-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Corrosion Polarization Glass Radio frequency Sputtering Contacts Chromium alloys Shape memory alloys Electrons Spectroscopy
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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