NDLI: An offset temperature coefficient in SQUID sensors

Content Provider	IEEE Xplore Digital Library
Author	Opfer, J. Pierce, J.
Copyright Year	1965
Abstract	Output offsets in SQUID sensors which accompany changes in the sensor temperature have been measured under varying conditions of magnetic stress applied to the sensor films. It is shown that there is an offset temperature coefficient (OTC), characterizing a reversible variation of the offset with temperature, which depends upon magnetic stress. Further, the variations of the OTC with magnetic stress are shown to be reversible for stress values below a critical value. Above this critical value, an irreversible change in the OTC occurs. This change can be annealed out by heating the sensor above its critical temperature. Two mechanisms which are capable of producing an OTC which behaves in this manner are discussed in quantitative terms. One mechanism involves temperature dependent pinning forces and the other involves the temperature dependent shielding currents which flow in response to magnetic stress. A simple technique for minimizing the deleterious effects of the OTC on magnetic measurements is described.
Sponsorship	IEEE Magnetics Society
Starting Page	369
Ending Page	371
Page Count	3
File Size	332526
File Format	PDF
ISSN	00189464
Volume Number	13
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1977-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature sensors SQUIDs Magnetic sensors Sensor phenomena and characterization Temperature dependence Temperature measurement Stress measurement Magnetic films Annealing Heating
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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