NDLI: Automatic Digital Method for Measuring the Permittivity of Thin Dielectric Films

Content Provider	IEEE Xplore Digital Library
Author	Rzepecka, M.A. Hamid, M.A.K.
Copyright Year	1963
Description	One of the most promising techniques for measuring the electric permittivity at microwave frequencies of thin dielectric materials of the order of 0.1 to 10 /spl mu/m, is the cavity perturbation method. For thin films of this type, it is necessary to determine accurately and display small changes in the resonant frequency and Q factor of the cavity in the presence of the material sample. A circuit for the simultaneous measurement and digital readout of the resonant frequency and Q factor of microwave cavity is described. For the resonant frequency measurement, a very efficient automatic frequency circuit, with a homodyne modulation-detection bridge and frequency stabilization loop, is applied. Theoretical analysis and experiments results with this circuit show that an accuracy of 5x10/sup -7/can be achieved in the resonant frequency measurement. For measuring the Q factor, two similar circuits are described. The technique is based on measuring the phase shift of the envelope of an amplitude modulated microwave signal when this signal is transmitted through a resonant cavity at resonance. Although an accuracy of 0.5 percent in the Q factor can be achieved, it is shown that the main limiting factor in both circuits is the accuracy of phase shift determination at RF frequencies.
Sponsorship	IEEE Microwave Theory and Techniques Society
Starting Page	30
Ending Page	37
Page Count	8
File Size	773108
File Format	PDF
ISSN	00189480
Volume Number	20
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1972-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Dielectric measurements Permittivity measurement Dielectric films Frequency measurement Resonant frequency Q factor Microwave measurements RLC circuits Dielectric materials Q measurement
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electrical and Electronic Engineering Radiation

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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