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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Matsushita, S. Konishi, S. Sakurai, Y. |
| Copyright Year | 1965 |
| Abstract | A Kerr magnetooptical ammeter is described which uses a Permalloy thin film in order to make contact-free measurements of the current flowing through a conductor. The device is useful for current measurement in high-voltage lines. In this ammeter, the strength of the current is measured by measuring the position of a domain wall which traverses a narrow channel sensor composed of a Permalloy thin film under the stray magnetic field due to a current. Contact-free observation of the domain wall is achieved by means of a Kerr magnetooptical apparatus using a high-pressure mercury lamp as a light source. The easy axis of the Permalloy thin film is parallel to the stray magnetic field. The domain wall traverses a distance of 15 mm at 70 amperes. The size of the sensor is 0.5 by 20 mm. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 569 |
| Ending Page | 571 |
| Page Count | 3 |
| File Size | 275514 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 6 |
| Issue Number | 3 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1970-09-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Ammeters Current measurement Magnetic field measurement Magnetic domain walls Magnetic sensors Magnetooptic devices Position measurement Thin film sensors Magnetic films Transistors |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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