NDLI: Statistics of atomic frequency standards

Content Provider	IEEE Xplore Digital Library
Author	Allan, D.W.
Copyright Year	1963
Abstract	A theoretical development is presented which results in a relationship between the expectation value of the standard deviation of the frequency fluctuations for any finite number of data samples and the infinite time average value of the standard deviation, which provides an invariant measure of an important quality factor of a frequency standard. A practical and straightforward method of determining the power spectral density of the frequency fluctuations from the variance of the frequency fluctuations, the sampling time, the number of samples taken, and the dependence on system bandwidth is also developed. Additional insight is also given into some of the problems that arise from the presence of "flicker noise" (spectrum proportional to \|ω\|^-1) modulation of the frequency of an oscillator. The theory is applied in classifying the types of noise on the signals of frequency standards made available at NBS, Boulder Laboratories, such as: masers (both H and N¹⁵H3), the cesium beam frequency standard employed as the U. S. Frequency Standard, and rubidium gas cells. "Flicker noise" frequency modulation was not observed on the signals of masers for sampling times ranging from 0.1 second to 4 hours. In a comparison between the NBS hydrogen maser and the NBS III cesium beam, uncorrelated random noise was observed on the frequency fluctuations for sampling times extending to 4 hours; the fractional standard deviations of the frequency fluctuations were as low as 5 parts in 10¹⁴.
Sponsorship	IEEE Publication
Starting Page	221
Ending Page	230
Page Count	10
File Size	963483
File Format	PDF
ISSN	00189219
Volume Number	54
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1966-02-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Statistics Atomic clocks Frequency Fluctuations 1f noise Measurement standards Standards development Sampling methods NIST Masers
Content Type	Text
Resource Type	Article
Subject	Computer Science Electrical and Electronic Engineering

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