NDLI: The Performance and Capability of Cesium Beam Frequency Standards at the National Bureau of Standards

Content Provider	IEEE Xplore Digital Library
Author	Beehler, R. E. Glaze, D. J.
Copyright Year	1963
Description	NBS II, the older of the two cesium atomic beam frequency standards which are used alternatively as the United States Frequency Standard, has been operating for more than five years. The contribution to inaccuracy produced by uncertainties in the C field has been reduced by a factor of 30 to ±2 × 10-13. The average precision of measurement (standard deviation of the mean) has been demonstrated to be 1 × 10-12 for averaging times of 1 hour and 2 × 10-13 for 12 hours. The overall accuracy is considered to be ±8 × 10-123¿. A new cesium standard, NBS III with an interaction length of 3.66 meters is in operation and has demonstrated an improved precision of 1 × 10-13 over 2 hours and an accuracy of ±5 × 10-123¿. The C field contributions to inaccuracy in this machine have been reduced to ±1 × 10-13. Considerable effort has been devoted to the detection and elimination of small frequency shifts produced by various electronic components of the excitation systems. In spite of the various improvements effected, a small unexplained difference in frequency of about 1 × 10-12 continues to exist between the standards. The extremely high stability of the difference frequency, however, suggests that resolution of the difficulties should result in an accuracy capability of perhaps ±1 × 10-123¿.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	48
Ending Page	55
Page Count	8
File Size	2824143
File Format	PDF
ISSN	00189456
Volume Number	15
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1966-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Frequency NIST Standards development Glazes Atomic beams Masers Testing Measurement standards Electronic components Stability
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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