NDLI: Robustness Analysis and Experimental Validation of a Fault Detection and Isolation Method for the Modular Multilevel Converter

Content Provider	IEEE Xplore Digital Library
Author	Shuai Shao Watson, A.J. Clare, J.C. Wheeler, P.W.
Copyright Year	1986
Abstract	This paper presents a fault detection and isolation (FDI) method for open-circuit faults of power semiconductor devices in a modular multilevel converter (MMC). The proposed FDI method is simple with only one sliding-mode observer (SMO) equation and requires no additional transducers. The method is based on an SMO for the circulating current in an MMC. An open-circuit fault of power semiconductor device is detected when the observed circulating current diverges from the measured one. A fault is located by employing an assumption-verification process. To improve the robustness of the proposed FDI method, a new technique based on the observer injection term is introduced to estimate the value of the uncertainties and disturbances; this estimated value can be used to compensate the uncertainties and disturbances. As a result, the proposed FDI scheme can detect and locate an open-circuit fault in a power semiconductor device while ignoring parameter uncertainties, measurement error, and other bounded disturbances. The FDI scheme has been implemented in a field-programmable gate array using fixed-point arithmetic and tested on a single-phase MMC prototype. Experimental results under different load conditions show that an open-circuit faulty power semiconductor device in an MMC can be detected and located in less than 50 ms.
Sponsorship	IEEE Power Electronics Society
Starting Page	3794
Ending Page	3805
Page Count	12
File Size	3881879
File Format	PDF
ISSN	08858993
Volume Number	31
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2016-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Observers Semiconductor device measurement Power semiconductor devices Logic gates Measurement uncertainty Fault detection sliding mode observer Fault detection and isolation modular multilevel converter sliding-mode observer (SMO) Fault detection and isolation (FDI) modular multilevel converter (MMC)
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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