NDLI: Cox-Proportional Hazards Modeling in Reliability Analysis

Content Provider	IEEE Xplore Digital Library
Author	Lingling Li Dongjuan Ma Zhigang Li
Copyright Year	2011
Abstract	Ambient temperature is an important factor influencing the reliability of electromagnetic relays. The effect of different environmental temperatures on relay lifetime can be examined through the Cox-proportional hazards model (PHM). In this paper, relay life tests were carried out at -20 °C, 20 °C, and 55 °C. Relay lifetime data were collected at various temperature conditions and were integrated to establish a Weibull PHM of electromagnetic relays. A comparative analysis of the experimental data indicates that an ambient temperature has a significant influence on contact resistance. The characteristic life, the mean life, and the probability density function of failure under temperature conditions not tested in the conducted experiment were estimated through the implementation of Cox PHM. Both the characteristic life and mean life decrease significantly with increasing ambient temperature. The perspectives and the methodology of the implementation of the Weibull PHM presented in this paper are generic and could be adopted for other systems/products directly.
Starting Page	1582
Ending Page	1589
Page Count	8
File Size	2550252
File Format	PDF
ISSN	21563950
Volume Number	5
Issue Number	11
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Relays Reliability Contact resistance Temperature Prognostics and health management Electromagnetics Stress Weibull distribution. Electromagnetic relays lifetime proportional hazards model (PHM) testing temperature Weibull distribution
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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