NDLI: Implications of Scales in Processing of Information

Content Provider	IEEE Xplore Digital Library
Author	Tiwari, S.
Copyright Year	1963
Abstract	Memory and logic devices in processing of information employ deterministically correct binary manipulation by a large ensemble of small devices. Smallest critical dimensions on a chip are in nanometers and the largest are in centimeters. Within the device themselves, 3-D, 2-D, 1-D, or even 0-D effects and their properties may be employed. This integrated circuit ensemble in its present form manipulates the information for an informational objective under constraints, among many, of energy, time, and absolute correctness. Four example sets illustrating the consequences of this approach arising from statistical, thermodynamic, quantum-mechanic, and information mechanic considerations are analyzed. The first illustrates the implication on a minimum in energy in any binary state change of >250k_B T. The second illustrates the connection between the nature of memory mechanism to the fluctuations and their guiding statistics that lead to the variability and errors. The third illustrates the limits arising in dissipative access due to dimensionality change. The fourth illustrates the interaction between fluctuations and on-chip signal transmission and manipulation with their resultant constraints. We tie this analysis to devices aimed at subthreshold conduction control, the change to on-state and low voltage operations. These examples illustrate the constraints placed on the reductive march through the connections of scales that leave the electronic ensemble nearly nine orders of magnitude off the thermodynamic capacity in information efficiency. A naturally probabilistic Bayesian computation example is provided as an alternative toward achieving efficiency.
Sponsorship	IEEE Publication
Starting Page	1250
Ending Page	1273
Page Count	24
File Size	2627904
File Format	PDF
ISSN	00189219
Volume Number	103
Issue Number	8
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-01-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Memory management Threshold voltage Switches Inverters Logic gates Information processing CMOS integrated circuits variability Bayesian computing bistable memory dimensionality dissipation errors ferroelectrics fluctuations inexact computing logic memory minimum energy nanoelectronics normal Gaussian statistics Poisson statistics quantum random-walk memory scales subthreshold swing tunnel diodes two-level system
Content Type	Text
Resource Type	Article
Subject	Computer Science Electrical and Electronic Engineering

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