NDLI: Remote Sensing Image Matching Based on Adaptive Binning SIFT Descriptor

Content Provider	IEEE Xplore Digital Library
Author	Sedaghat, A. Ebadi, H.
Copyright Year	1980
Abstract	Image matching based on local invariant features is crucial for many photogrammetric and remote sensing applications such as image registration and image mosaicking. In this paper, a novel local feature descriptor named adaptive binning scale-invariant feature transform (AB-SIFT) for fully automatic remote sensing image matching that is robust to local geometric distortions is proposed. The main idea of the proposed method is an adaptive binning strategy to compute the local feature descriptor. The proposed descriptor is computed on a normalized region defined by an improved version of the prominent Hessian affine feature extraction algorithm called the uniform robust Hessian affine algorithm. Unlike common distribution-based descriptors, the proposed descriptor uses an adaptive histogram quantization strategy for both location and gradient orientations, which is robust and actually resistant to a local viewpoint distortion and extremely increases the discriminability and robustness of the final AB-SIFT descriptor. In addition to the SIFT descriptor, the proposed adaptive quantization strategy can be easily extended for other distribution-based descriptors. Experimental results on both synthetic and real image pairs show that the proposed AB-SIFT matching method is more robust and accurate than state-of-the-art methods, including the SIFT, DAISY, the gradient location and orientation histogram, the local intensity order pattern, and the binary robust invariant scale keypoint.
Sponsorship	IEEE Geoscience and Remote Sensing Society IEEE URSI
Starting Page	5283
Ending Page	5293
Page Count	11
File Size	2614535
File Format	PDF
ISSN	01962892
Volume Number	53
Issue Number	10
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Feature extraction Histograms Robustness Remote sensing Image matching Quantization (signal) Satellites uniform robust Hessian affine (URHA) Adaptive binning scale-invariant feature transform (AB-SIFT) image matching local feature descriptor
Content Type	Text
Resource Type	Article
Subject	Earth and Planetary Sciences Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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