NDLI: Improvements to the Volume Measurement of <sup>28</sup>Si Spheres to Determine the Avogadro Constant

Content Provider	IEEE Xplore Digital Library
Author	Kuramoto, N. Azuma, Y. Inaba, H. Feng-Lei Hong Fujii, K.
Copyright Year	1963
Abstract	In the determination of the Avogadro constant using the X-ray crystal density method with a ²⁸Si-enriched crystal prepared by the International Avogadro Coordination (IAC) project, the volume measurement and surface analysis of ²⁸Si spheres play a crucial role. For accurate volume determination, an optical interferometer has been improved taking account of the geometrical shape of the optical components. Furthermore, a new spectroscopic ellipsometer with a sphere rotation system has been developed for accurate surface analysis. The optical interferometer and the ellipsometer have been used for the volume determination and surface analysis of the ²⁸Si spheres repolished by the IAC, respectively. On the basis of the preliminary uncertainty estimation, the relative standard uncertainty of the apparent volume measurement has been reduced from 4.4 $\times 10^{-8}$ to 2.7 $\times 10^{-8}$ by the improvement of the interferometer. The number of ellipsometric measurement points on the sphere surface has been increased from 20 to 7782 by the installation of the new ellipsometer, yielding more reliable information on the sphere surface. Details of the improvements and the preliminary results of the measurements of the ²⁸Si spheres are given.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	1650
Ending Page	1656
Page Count	7
File Size	2004852
File Format	PDF
ISSN	00189456
Volume Number	64
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Uncertainty Optical interferometry Volume measurement Measurement by laser beam Standards Optical variables measurement Silicon volume measurement. Avogadro constant diameter measurement optical interferometer silicon crystal spectroscopic ellipsometer volume measurement
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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