NDLI: A Reliability Enhanced Address Mapping Strategy for Three-Dimensional (3-D) NAND Flash Memory

Content Provider	IEEE Xplore Digital Library
Author	Yi Wang Zili Shao Chan, H.C.B. Bathen, L.A.D. Dutt, N.D.
Copyright Year	1993
Abstract	The linear scaling down of NAND flash memory is approaching its physical, electrical, and reliability limitations. To maintain the current trend of increasing bit density and reducing bit per cost, 3-D flash memory is emerging as a viable solution to fulfill the ever-increasing demands of storage capacity. In 3-D NAND flash memory, multiple layers are stacked to provide ultrahigh density storage devices. However, the physical architecture of 3-D flash memory leads to a higher probability of disturbance to adjacent physical pages and greatly increases bit error rates. This paper presents a novel physical-location-aware address mapping strategy for 3-D NAND flash memory. It permutes the physical mapping of pages and maximizes the distance between the consecutively logical pages, which can significantly reduce the disturbance to adjacent physical pages and effectively enhance the reliability. The proposed mapping strategy is applied to a representative flash storage system. Experimental results show that the proposed scheme can reduce uncorrectable page errors by 70.16% with less than 10.01% space overhead in comparison with the baseline scheme.
Sponsorship	IEEE Computer Society Association for Computing Machinery (ACM)/SIGDA IEEE Computer Society Technical Committee on Design Automation
Starting Page	2402
Ending Page	2410
Page Count	9
File Size	1032253
File Format	PDF
ISSN	10638210
Volume Number	22
Issue Number	11
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Ash Reliability Physical layer Drives Resource management Educational institutions Logic gates reliability 3-D integrated circuits data storage systems error correction codes fault tolerance flash memories
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Software Hardware and Architecture

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