NDLI: When Does "Diversity"' in Development Reduce Common Failures? Insights from Probabilistic Modeling

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When Does "Diversity"' in Development Reduce Common Failures? Insights from Probabilistic Modeling

Content Provider	IEEE Xplore Digital Library
Author	Salako, K. Strigini, L.
Copyright Year	2004
Abstract	Fault tolerance via diverse redundancy, with multiple "versions" of a system in a redundant configuration, is an attractive defence against design faults. To reduce the probability of common failures, development and procurement practices pursue "diversity" between the ways the different versions are developed. But difficult questions remain open about which practices are more effective to this aim. About these questions, probabilistic models have helped by exposing fallacies in "common sense" judgements. However, most make very restrictive assumptions. They model well scenarios in which diverse versions are developed in rigorous isolation from each other: A condition that many think desirable, but is unlikely in practice. We extend these models to cover nonindependent development processes for diverse versions. This gives us a rigorous way of framing claims and open questions about how best to pursue diversity, and about the effects - negative and positive - of commonalities between developments, from specification corrections to the choice of test cases. We obtain three theorems that, under specific scenarios, identify preferences between alternative ways of seeking diversity. We also discuss nonintuitive issues, including how expected system reliability may be improved by creating intentional "negative" dependences between the developments of different versions.
Sponsorship	IEEE Computer Society
Starting Page	193
Ending Page	206
Page Count	14
File Size	1245878
File Format	PDF
ISSN	15455971
Volume Number	11
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Phase frequency detector Software Reliability Random variables Computational modeling Correlation Probabilistic logic reliability Common-mode failure software diversity fault tolerance multiversion software probability of failure on demand
Content Type	Text
Resource Type	Article
Subject	Computer Science Electrical and Electronic Engineering

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